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比表面(mian)(mian)積及(ji)孔(kong)隙(xi)度測(ce)試(shi)分(fen)(fen)析(xi)(xi)儀，吸附、脫附等(deng)溫線測(ce)定(ding)。單(dan)點(dian)和(he)多點(dian)BET比表面(mian)(mian)積。Langmuir比表面(mian)(mian)積測(ce)定(ding)。粒度估算和(he)真密度測(ce)試(shi)、孔(kong)隙(xi)率及(ji)孔(kong)隙(xi)度分(fen)(fen)析(xi)(xi)。BJH介孔(kong)、大孔(kong)分(fen)(fen)析(xi)(xi)。t-plots圖法微孔(kong)分(fen)(fen)析(xi)(xi)，以及(ji)外表面(mian)(mian)積測(ce)定(ding)。as-plots微孔(kong)總(zong)面(mian)(mian)積。MP法微孔(kong)分(fen)(fen)析(xi)(xi)。可以進(jin)行(xing)微孔(kong)DR理(li)論、HK狹(xia)縫(feng)孔(kong)理(li)論、SF圓(yuan)柱形孔(kong)理(li)論分(fen)(fen)析(xi)(xi)，并可以升級進(jin)行(xing)DFT密度函(han)數(shu)理(li)論；包括NLDFT理(li)論等(deng)

新款比表面(mian)(mian)與孔(kong)(kong)(kong)徑分(fen)析儀(yi)，吸附、脫附等(deng)溫線測(ce)定(ding)。單點(dian)和多點(dian)BET比表面(mian)(mian)積。Langmuir比表面(mian)(mian)積測(ce)定(ding)。粒度估算和真密度測(ce)試、孔(kong)(kong)(kong)隙率(lv)及孔(kong)(kong)(kong)隙度分(fen)析。BJH介孔(kong)(kong)(kong)、大(da)孔(kong)(kong)(kong)分(fen)析。t-plots圖法(fa)微孔(kong)(kong)(kong)分(fen)析，以(yi)(yi)及外表面(mian)(mian)積測(ce)定(ding)。as-plots微孔(kong)(kong)(kong)總面(mian)(mian)積。MP法(fa)微孔(kong)(kong)(kong)分(fen)析。可以(yi)(yi)進(jin)(jin)行微孔(kong)(kong)(kong)DR理(li)(li)論、HK狹縫孔(kong)(kong)(kong)理(li)(li)論、SF圓(yuan)柱(zhu)形孔(kong)(kong)(kong)理(li)(li)論分(fen)析，并可以(yi)(yi)升級進(jin)(jin)行DFT密度函數(shu)理(li)(li)論；包括NLDFT理(li)(li)論等(deng)

自(zi)動二氧化鋁比(bi)表(biao)面(mian)與孔(kong)(kong)徑分(fen)(fen)(fen)析(xi)儀，吸附(fu)(fu)、脫(tuo)附(fu)(fu)等(deng)溫線(xian)測(ce)定。單點(dian)和多(duo)點(dian)BET比(bi)表(biao)面(mian)積。Langmuir比(bi)表(biao)面(mian)積測(ce)定。粒度(du)估算(suan)和真密度(du)測(ce)試、孔(kong)(kong)隙率及孔(kong)(kong)隙度(du)分(fen)(fen)(fen)析(xi)。BJH介孔(kong)(kong)、大孔(kong)(kong)分(fen)(fen)(fen)析(xi)。t-plots圖法(fa)微(wei)孔(kong)(kong)分(fen)(fen)(fen)析(xi)，以(yi)及外表(biao)面(mian)積測(ce)定。as-plots微(wei)孔(kong)(kong)總(zong)面(mian)積。MP法(fa)微(wei)孔(kong)(kong)分(fen)(fen)(fen)析(xi)。可以(yi)進(jin)行微(wei)孔(kong)(kong)DR理(li)(li)論、HK狹縫孔(kong)(kong)理(li)(li)論、SF圓柱形孔(kong)(kong)理(li)(li)論分(fen)(fen)(fen)析(xi)，并可以(yi)升級(ji)進(jin)行DFT密度(du)函數(shu)理(li)(li)論；包括NLDFT理(li)(li)論等(deng)

全自動Langmuir比表面積(ji)分析(xi)儀，吸(xi)附(fu)、脫附(fu)等溫線測(ce)(ce)定。單點和(he)多(duo)點BET比表面積(ji)。Langmuir比表面積(ji)測(ce)(ce)定。粒度估算和(he)真密度測(ce)(ce)試、孔(kong)(kong)(kong)隙率(lv)及(ji)孔(kong)(kong)(kong)隙度分析(xi)。BJH介孔(kong)(kong)(kong)、大孔(kong)(kong)(kong)分析(xi)。t-plots圖法微(wei)孔(kong)(kong)(kong)分析(xi)，以及(ji)外表面積(ji)測(ce)(ce)定。as-plots微(wei)孔(kong)(kong)(kong)總面積(ji)。MP法微(wei)孔(kong)(kong)(kong)分析(xi)。可以進(jin)行微(wei)孔(kong)(kong)(kong)DR理(li)(li)論(lun)、HK狹縫孔(kong)(kong)(kong)理(li)(li)論(lun)、SF圓柱形孔(kong)(kong)(kong)理(li)(li)論(lun)分析(xi)，并可以升(sheng)級進(jin)行DFT密度函數理(li)(li)論(lun)；包括NLDFT理(li)(li)論(lun)等

全自動片材比表(biao)面(mian)與(yu)孔(kong)(kong)(kong)(kong)(kong)徑分(fen)析(xi)儀(yi)，吸附(fu)、脫附(fu)等溫(wen)線測(ce)(ce)定(ding)。單點和多(duo)點BET比表(biao)面(mian)積。Langmuir比表(biao)面(mian)積測(ce)(ce)定(ding)。粒度估算(suan)和真(zhen)密(mi)度測(ce)(ce)試、孔(kong)(kong)(kong)(kong)(kong)隙率及孔(kong)(kong)(kong)(kong)(kong)隙度分(fen)析(xi)。BJH介孔(kong)(kong)(kong)(kong)(kong)、大孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)。t-plots圖(tu)法微孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)，以(yi)(yi)(yi)及外表(biao)面(mian)積測(ce)(ce)定(ding)。as-plots微孔(kong)(kong)(kong)(kong)(kong)總面(mian)積。MP法微孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)。可(ke)以(yi)(yi)(yi)進行微孔(kong)(kong)(kong)(kong)(kong)DR理(li)(li)論、HK狹縫孔(kong)(kong)(kong)(kong)(kong)理(li)(li)論、SF圓柱形(xing)孔(kong)(kong)(kong)(kong)(kong)理(li)(li)論分(fen)析(xi)，并可(ke)以(yi)(yi)(yi)升級進行DFT密(mi)度函數(shu)理(li)(li)論；包括NLDFT理(li)(li)論等