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比表(biao)面(mian)積(ji)及(ji)孔(kong)(kong)(kong)(kong)(kong)隙度測試(shi)分(fen)析(xi)(xi)儀，吸附、脫附等溫線測定(ding)。單點(dian)和多(duo)點(dian)BET比表(biao)面(mian)積(ji)。Langmuir比表(biao)面(mian)積(ji)測定(ding)。粒度估算和真(zhen)密度測試(shi)、孔(kong)(kong)(kong)(kong)(kong)隙率及(ji)孔(kong)(kong)(kong)(kong)(kong)隙度分(fen)析(xi)(xi)。BJH介孔(kong)(kong)(kong)(kong)(kong)、大孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)。t-plots圖法微(wei)孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)，以(yi)(yi)及(ji)外(wai)表(biao)面(mian)積(ji)測定(ding)。as-plots微(wei)孔(kong)(kong)(kong)(kong)(kong)總面(mian)積(ji)。MP法微(wei)孔(kong)(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)。可(ke)以(yi)(yi)進行微(wei)孔(kong)(kong)(kong)(kong)(kong)DR理論(lun)、HK狹縫孔(kong)(kong)(kong)(kong)(kong)理論(lun)、SF圓柱形孔(kong)(kong)(kong)(kong)(kong)理論(lun)分(fen)析(xi)(xi)，并可(ke)以(yi)(yi)升級進行DFT密度函數理論(lun)；包括NLDFT理論(lun)等

新款(kuan)比(bi)(bi)表面(mian)與孔(kong)(kong)(kong)(kong)徑分(fen)析(xi)(xi)(xi)儀，吸附(fu)、脫附(fu)等溫(wen)線測定(ding)。單點和多點BET比(bi)(bi)表面(mian)積。Langmuir比(bi)(bi)表面(mian)積測定(ding)。粒度(du)(du)估算和真(zhen)密(mi)度(du)(du)測試、孔(kong)(kong)(kong)(kong)隙率及孔(kong)(kong)(kong)(kong)隙度(du)(du)分(fen)析(xi)(xi)(xi)。BJH介孔(kong)(kong)(kong)(kong)、大孔(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)(xi)。t-plots圖法(fa)(fa)微孔(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)(xi)，以(yi)(yi)及外(wai)表面(mian)積測定(ding)。as-plots微孔(kong)(kong)(kong)(kong)總面(mian)積。MP法(fa)(fa)微孔(kong)(kong)(kong)(kong)分(fen)析(xi)(xi)(xi)。可以(yi)(yi)進行微孔(kong)(kong)(kong)(kong)DR理論、HK狹縫(feng)孔(kong)(kong)(kong)(kong)理論、SF圓柱形孔(kong)(kong)(kong)(kong)理論分(fen)析(xi)(xi)(xi)，并可以(yi)(yi)升級進行DFT密(mi)度(du)(du)函數理論；包括NLDFT理論等

自(zi)動二氧化鋁比(bi)表(biao)(biao)面(mian)(mian)與孔(kong)徑分析儀(yi)，吸附、脫附等(deng)溫線(xian)測(ce)(ce)定(ding)(ding)。單點(dian)(dian)和(he)多點(dian)(dian)BET比(bi)表(biao)(biao)面(mian)(mian)積(ji)(ji)(ji)(ji)。Langmuir比(bi)表(biao)(biao)面(mian)(mian)積(ji)(ji)(ji)(ji)測(ce)(ce)定(ding)(ding)。粒度(du)估算和(he)真密(mi)度(du)測(ce)(ce)試、孔(kong)隙率(lv)及孔(kong)隙度(du)分析。BJH介孔(kong)、大孔(kong)分析。t-plots圖法微(wei)孔(kong)分析，以及外表(biao)(biao)面(mian)(mian)積(ji)(ji)(ji)(ji)測(ce)(ce)定(ding)(ding)。as-plots微(wei)孔(kong)總面(mian)(mian)積(ji)(ji)(ji)(ji)。MP法微(wei)孔(kong)分析。可(ke)以進(jin)行(xing)微(wei)孔(kong)DR理(li)論(lun)、HK狹縫孔(kong)理(li)論(lun)、SF圓柱形孔(kong)理(li)論(lun)分析，并可(ke)以升級進(jin)行(xing)DFT密(mi)度(du)函數理(li)論(lun)；包括NLDFT理(li)論(lun)等(deng)

全自(zi)動Langmuir比(bi)(bi)表面(mian)積(ji)(ji)分析(xi)儀，吸附(fu)、脫附(fu)等溫線(xian)測定。單(dan)點(dian)和(he)多點(dian)BET比(bi)(bi)表面(mian)積(ji)(ji)。Langmuir比(bi)(bi)表面(mian)積(ji)(ji)測定。粒度估算和(he)真密度測試、孔(kong)(kong)隙率及孔(kong)(kong)隙度分析(xi)。BJH介(jie)孔(kong)(kong)、大孔(kong)(kong)分析(xi)。t-plots圖法微孔(kong)(kong)分析(xi)，以(yi)及外(wai)表面(mian)積(ji)(ji)測定。as-plots微孔(kong)(kong)總面(mian)積(ji)(ji)。MP法微孔(kong)(kong)分析(xi)。可以(yi)進行微孔(kong)(kong)DR理論、HK狹縫孔(kong)(kong)理論、SF圓(yuan)柱形孔(kong)(kong)理論分析(xi)，并(bing)可以(yi)升級進行DFT密度函數理論；包(bao)括NLDFT理論等

全自動片材比(bi)(bi)表面(mian)與孔(kong)(kong)徑分(fen)(fen)析(xi)(xi)儀(yi)，吸附、脫附等溫線測(ce)定。單(dan)點(dian)和多(duo)點(dian)BET比(bi)(bi)表面(mian)積(ji)。Langmuir比(bi)(bi)表面(mian)積(ji)測(ce)定。粒度估算和真密度測(ce)試、孔(kong)(kong)隙(xi)率及(ji)孔(kong)(kong)隙(xi)度分(fen)(fen)析(xi)(xi)。BJH介(jie)孔(kong)(kong)、大孔(kong)(kong)分(fen)(fen)析(xi)(xi)。t-plots圖法(fa)微孔(kong)(kong)分(fen)(fen)析(xi)(xi)，以及(ji)外表面(mian)積(ji)測(ce)定。as-plots微孔(kong)(kong)總面(mian)積(ji)。MP法(fa)微孔(kong)(kong)分(fen)(fen)析(xi)(xi)。可以進行微孔(kong)(kong)DR理(li)論(lun)、HK狹縫孔(kong)(kong)理(li)論(lun)、SF圓柱形(xing)孔(kong)(kong)理(li)論(lun)分(fen)(fen)析(xi)(xi)，并可以升(sheng)級(ji)進行DFT密度函數理(li)論(lun)；包括NLDFT理(li)論(lun)等